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1. Identity statement
Reference TypeConference Paper (Conference Proceedings)
Sitesibgrapi.sid.inpe.br
Holder Codeibi 8JMKD3MGPEW34M/46T9EHH
Identifier6qtX3pFwXQZeBBx/w5v44
Repositorysid.inpe.br/banon/2002/11.06.12.09
Last Update2002:11.06.02.00.00 (UTC) administrator
Metadata Repositorysid.inpe.br/banon/2002/11.06.12.09.43
Metadata Last Update2022:06.14.00.12.09 (UTC) administrator
DOI10.1109/SIBGRA.2000.883916
Citation KeyMayer:2000:ImTeAn
TitleImage-based texture analysis for realistic image synthesis
Year2000
Access Date2024, Mar. 28
Number of Files1
Size954 KiB
2. Context
AuthorMayer, Heinz
EditorCarvalho, Paulo Cezar Pinto
Walter, Marcelo
Conference NameBrazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI)
Conference LocationGramado, RS, Brazil
Date17-20 Oct. 2000
PublisherIEEE Computer Society
Publisher CityLos Alamitos
Pages219-226
Book TitleProceedings
Tertiary TypeFull Paper
OrganizationSBC - Brazilian Computer Society
History (UTC)2008-07-17 14:10:50 :: administrator -> banon ::
2008-08-26 15:23:02 :: banon -> administrator ::
2009-08-13 20:36:58 :: administrator -> banon ::
2010-08-28 20:00:10 :: banon -> administrator ::
2022-06-14 00:12:09 :: administrator -> :: 2000
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Version Typefinaldraft
Keywordsimage texture
image based texture analysis
realistic image synthesis
surface reflectance
digital image synthesis
intensity values
highlighting artifacts
image based measurement system
bidirectional reflectance distribution function
BRDF values
reflectance model
diffuse reflectance coefficient
compact description
measured surface properties
arbitrary shape
measurement system
standard CCD camera
light source
AbstractWe present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used
Arrangement 1urlib.net > SDLA > Fonds > SIBGRAPI 2000 > Image-based texture analysis...
Arrangement 2urlib.net > SDLA > Fonds > Full Index > Image-based texture analysis...
doc Directory Contentaccess
source Directory Contentthere are no files
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4. Conditions of access and use
data URLhttp://urlib.net/ibi/6qtX3pFwXQZeBBx/w5v44
zipped data URLhttp://urlib.net/zip/6qtX3pFwXQZeBBx/w5v44
Target File219-226.pdf
User Groupadministrator
Visibilityshown
5. Allied materials
Next Higher Units8JMKD3MGPEW34M/46PN6AP
8JMKD3MGPEW34M/4742MCS
Citing Item Listsid.inpe.br/sibgrapi/2022/04.27.03.08 1
Host Collectionsid.inpe.br/banon/2001/03.30.15.38
6. Notes
NotesThe conference was held in Gramado, RS, Brazil, from October 17 to 20.
Empty Fieldsaffiliation archivingpolicy archivist area callnumber contenttype copyholder copyright creatorhistory descriptionlevel dissemination documentstage e-mailaddress edition electronicmailaddress format group isbn issn label language lineage mark mirrorrepository nextedition numberofvolumes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup readpermission resumeid rightsholder schedulinginformation secondarydate secondarykey secondarymark secondarytype serieseditor session shorttitle sponsor subject tertiarymark type url volume


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