Fechar

1. Identificação
Tipo de ReferênciaArtigo em Evento (Conference Proceedings)
Sitesibgrapi.sid.inpe.br
Código do Detentoribi 8JMKD3MGPEW34M/46T9EHH
Identificador6qtX3pFwXQZeBBx/w5v44
Repositóriosid.inpe.br/banon/2002/11.06.12.09
Última Atualização2002:11.06.02.00.00 (UTC) administrator
Repositório de Metadadossid.inpe.br/banon/2002/11.06.12.09.43
Última Atualização dos Metadados2022:06.14.00.12.09 (UTC) administrator
DOI10.1109/SIBGRA.2000.883916
Chave de CitaçãoMayer:2000:ImTeAn
TítuloImage-based texture analysis for realistic image synthesis
Ano2000
Data de Acesso10 fev. 2025
Número de Arquivos1
Tamanho954 KiB
2. Contextualização
AutorMayer, Heinz
EditorCarvalho, Paulo Cezar Pinto
Walter, Marcelo
Nome do EventoBrazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI)
Localização do EventoGramado, RS, Brazil
Data17-20 Oct. 2000
Editora (Publisher)IEEE Computer Society
Cidade da EditoraLos Alamitos
Páginas219-226
Título do LivroProceedings
Tipo TerciárioFull Paper
OrganizaçãoSBC - Brazilian Computer Society
Histórico (UTC)2008-07-17 14:10:50 :: administrator -> banon ::
2008-08-26 15:23:02 :: banon -> administrator ::
2009-08-13 20:36:58 :: administrator -> banon ::
2010-08-28 20:00:10 :: banon -> administrator ::
2022-06-14 00:12:09 :: administrator -> :: 2000
3. Conteúdo e estrutura
É a matriz ou uma cópia?é a matriz
Estágio do Conteúdoconcluido
Transferível1
Tipo de Versãofinaldraft
Palavras-Chaveimage texture
image based texture analysis
realistic image synthesis
surface reflectance
digital image synthesis
intensity values
highlighting artifacts
image based measurement system
bidirectional reflectance distribution function
BRDF values
reflectance model
diffuse reflectance coefficient
compact description
measured surface properties
arbitrary shape
measurement system
standard CCD camera
light source
ResumoWe present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used
Arranjo 1urlib.net > SDLA > Fonds > SIBGRAPI 2000 > Image-based texture analysis...
Arranjo 2urlib.net > SDLA > Fonds > Full Index > Image-based texture analysis...
Conteúdo da Pasta docacessar
Conteúdo da Pasta sourcenão têm arquivos
Conteúdo da Pasta agreementnão têm arquivos
4. Condições de acesso e uso
URL dos dadoshttp://urlib.net/ibi/6qtX3pFwXQZeBBx/w5v44
URL dos dados zipadoshttp://urlib.net/zip/6qtX3pFwXQZeBBx/w5v44
Arquivo Alvo219-226.pdf
Grupo de Usuáriosadministrator
Visibilidadeshown
5. Fontes relacionadas
Unidades Imediatamente Superiores8JMKD3MGPEW34M/46PN6AP
8JMKD3MGPEW34M/4742MCS
Lista de Itens Citandosid.inpe.br/sibgrapi/2022/04.27.03.08 37
sid.inpe.br/sibgrapi/2022/06.10.21.49 2
Acervo Hospedeirosid.inpe.br/banon/2001/03.30.15.38
6. Notas
NotasThe conference was held in Gramado, RS, Brazil, from October 17 to 20.
Campos Vaziosaffiliation archivingpolicy archivist area callnumber contenttype copyholder copyright creatorhistory descriptionlevel dissemination documentstage e-mailaddress edition electronicmailaddress format group isbn issn label language lineage mark mirrorrepository nextedition numberofvolumes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup readpermission resumeid rightsholder schedulinginformation secondarydate secondarykey secondarymark secondarytype serieseditor session shorttitle sponsor subject tertiarymark type url volume


Fechar