1. Identificação | |
Tipo de Referência | Artigo em Evento (Conference Proceedings) |
Site | sibgrapi.sid.inpe.br |
Código do Detentor | ibi 8JMKD3MGPEW34M/46T9EHH |
Identificador | 6qtX3pFwXQZeBBx/w5v44 |
Repositório | sid.inpe.br/banon/2002/11.06.12.09 |
Última Atualização | 2002:11.06.02.00.00 (UTC) administrator |
Repositório de Metadados | sid.inpe.br/banon/2002/11.06.12.09.43 |
Última Atualização dos Metadados | 2022:06.14.00.12.09 (UTC) administrator |
DOI | 10.1109/SIBGRA.2000.883916 |
Chave de Citação | Mayer:2000:ImTeAn |
Título | Image-based texture analysis for realistic image synthesis  |
Ano | 2000 |
Data de Acesso | 10 fev. 2025 |
Número de Arquivos | 1 |
Tamanho | 954 KiB |
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2. Contextualização | |
Autor | Mayer, Heinz |
Editor | Carvalho, Paulo Cezar Pinto Walter, Marcelo |
Nome do Evento | Brazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI) |
Localização do Evento | Gramado, RS, Brazil |
Data | 17-20 Oct. 2000 |
Editora (Publisher) | IEEE Computer Society |
Cidade da Editora | Los Alamitos |
Páginas | 219-226 |
Título do Livro | Proceedings |
Tipo Terciário | Full Paper |
Organização | SBC - Brazilian Computer Society |
Histórico (UTC) | 2008-07-17 14:10:50 :: administrator -> banon :: 2008-08-26 15:23:02 :: banon -> administrator :: 2009-08-13 20:36:58 :: administrator -> banon :: 2010-08-28 20:00:10 :: banon -> administrator :: 2022-06-14 00:12:09 :: administrator -> :: 2000 |
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3. Conteúdo e estrutura | |
É a matriz ou uma cópia? | é a matriz |
Estágio do Conteúdo | concluido |
Transferível | 1 |
Tipo de Versão | finaldraft |
Palavras-Chave | image texture image based texture analysis realistic image synthesis surface reflectance digital image synthesis intensity values highlighting artifacts image based measurement system bidirectional reflectance distribution function BRDF values reflectance model diffuse reflectance coefficient compact description measured surface properties arbitrary shape measurement system standard CCD camera light source |
Resumo | We present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used |
Arranjo 1 | urlib.net > SDLA > Fonds > SIBGRAPI 2000 > Image-based texture analysis... |
Arranjo 2 | urlib.net > SDLA > Fonds > Full Index > Image-based texture analysis... |
Conteúdo da Pasta doc | acessar |
Conteúdo da Pasta source | não têm arquivos |
Conteúdo da Pasta agreement | não têm arquivos |
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4. Condições de acesso e uso | |
URL dos dados | http://urlib.net/ibi/6qtX3pFwXQZeBBx/w5v44 |
URL dos dados zipados | http://urlib.net/zip/6qtX3pFwXQZeBBx/w5v44 |
Arquivo Alvo | 219-226.pdf |
Grupo de Usuários | administrator |
Visibilidade | shown |
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5. Fontes relacionadas | |
Unidades Imediatamente Superiores | 8JMKD3MGPEW34M/46PN6AP 8JMKD3MGPEW34M/4742MCS |
Lista de Itens Citando | sid.inpe.br/sibgrapi/2022/04.27.03.08 37 sid.inpe.br/sibgrapi/2022/06.10.21.49 2 |
Acervo Hospedeiro | sid.inpe.br/banon/2001/03.30.15.38 |
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6. Notas | |
Notas | The conference was held in Gramado, RS, Brazil, from October 17 to 20. |
Campos Vazios | affiliation archivingpolicy archivist area callnumber contenttype copyholder copyright creatorhistory descriptionlevel dissemination documentstage e-mailaddress edition electronicmailaddress format group isbn issn label language lineage mark mirrorrepository nextedition numberofvolumes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup readpermission resumeid rightsholder schedulinginformation secondarydate secondarykey secondarymark secondarytype serieseditor session shorttitle sponsor subject tertiarymark type url volume |
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