author = "Mayer, Heinz",
                title = "Image-based texture analysis for realistic image synthesis",
                 year = "2000",
               editor = "Carvalho, Paulo Cezar Pinto and Walter, Marcelo",
                pages = "219--226",
         organization = "Brazilian Symposium on Computer Graphics and Image Processing, 13. 
            publisher = "IEEE Computer Society",
              address = "Los Alamitos",
                 note = "The conference was held in Gramado, RS, Brazil, from October 17 to 
             keywords = "image texture, image based texture analysis, realistic image 
                         synthesis, surface reflectance, digital image synthesis, intensity 
                         values, highlighting artifacts, image based measurement system, 
                         bidirectional reflectance distribution function, BRDF values, 
                         reflectance model, diffuse reflectance coefficient, compact 
                         description, measured surface properties, arbitrary shape, 
                         measurement system, standard CCD camera, light source.",
             abstract = "We present a method to measure reflectance and texture of surfaces 
                         in a one step process. For later use in digital image synthesis, 
                         it is mandatory to separate the gathered intensity values into 
                         these two parts to eliminate highlighting artifacts from textures. 
                         Our image based measurement system delivers bidirectional 
                         reflectance distribution function (BRDF) values distributed over 
                         the surface of the material under investigation. After fitting a 
                         reflectance model to the gathered data, we estimate the modulation 
                         of the diffuse reflectance coefficient which represents the 
                         texture. The last step analyzes the texture to get a parameterized 
                         and compact description of the measured surface properties. These 
                         results allow us to apply the gathered surface properties to 
                         objects with arbitrary shape and size. To keep the measurement 
                         system simple, a standard CCD camera and light source are used",
  conference-location = "Gramado, RS, Brazil",
      conference-year = "October",
         organisation = "SBC - Brazilian Computer Society",
           targetfile = "219-226.pdf",
        urlaccessdate = "2020, Nov. 29"