<?xml version="1.0" encoding="ISO-8859-1"?>
<metadatalist>
	<metadata ReferenceType="Conference Proceedings">
		<identifier>6qtX3pFwXQZeBBx/w5v44</identifier>
		<repository>sid.inpe.br/banon/2002/11.06.12.09</repository>
		<metadatarepository>sid.inpe.br/banon/2002/11.06.12.09.43</metadatarepository>
		<site>sibgrapi.sid.inpe.br 802</site>
		<citationkey>Mayer:2000:ImTeAn</citationkey>
		<author>Mayer, Heinz,</author>
		<title>Image-based texture analysis for realistic image synthesis</title>
		<conferencename>Brazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI)</conferencename>
		<year>2000</year>
		<editor>Carvalho, Paulo Cezar Pinto,</editor>
		<editor>Walter, Marcelo,</editor>
		<date>October</date>
		<publisheraddress>Los Alamitos</publisheraddress>
		<publisher>IEEE Computer Society</publisher>
		<conferencelocation>Gramado, RS, Brazil</conferencelocation>
		<keywords>image texture, image based texture analysis, realistic image synthesis, surface reflectance, digital image synthesis, intensity values, highlighting artifacts, image based measurement system, bidirectional reflectance distribution function, BRDF values, reflectance model, diffuse reflectance coefficient, compact description, measured surface properties, arbitrary shape, measurement system, standard CCD camera, light source.</keywords>
		<abstract>We present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used</abstract>
		<pages>219-226</pages>
		<notes>The conference was held in Gramado, RS, Brazil, from October 17 to 20.</notes>
		<organization>SBC - Brazilian Computer Society</organization>
		<tertiarytype>Full Paper</tertiarytype>
		<size>954 KiB</size>
		<numberoffiles>1</numberoffiles>
		<targetfile>219-226.pdf</targetfile>
		<lastupdate>2002:11.06.02.00.00 sid.inpe.br/banon/2001/03.30.15.38 administrator</lastupdate>
		<metadatalastupdate>2020:02.19.02.58.51 sid.inpe.br/banon/2001/03.30.15.38 administrator {D 2000}</metadatalastupdate>
		<usergroup>administrator</usergroup>
		<visibility>shown</visibility>
		<transferableflag>1</transferableflag>
		<hostcollection>sid.inpe.br/banon/2001/03.30.15.38</hostcollection>
		<contenttype>External Contribution</contenttype>
		<lasthostcollection>sid.inpe.br/banon/2001/03.30.15.38</lasthostcollection>
		<url>http://sibgrapi.sid.inpe.br/rep-/sid.inpe.br/banon/2002/11.06.12.09</url>
	</metadata>
</metadatalist>