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Reference TypeConference Proceedings
Identifier6qtX3pFwXQZeBBx/w5v44
Repositorysid.inpe.br/banon/2002/11.06.12.09
Metadatasid.inpe.br/banon/2002/11.06.12.09.43
Sitesibgrapi.sid.inpe.br
Citation KeyMayer:2000:ImTeAn
AuthorMayer, Heinz
TitleImage-based texture analysis for realistic image synthesis
Conference NameBrazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI)
Year2000
EditorCarvalho, Paulo Cezar Pinto
Walter, Marcelo
DateOctober
Publisher CityLos Alamitos
PublisherIEEE Computer Society
Conference LocationGramado, RS, Brazil
Keywordsimage texture, image based texture analysis, realistic image synthesis, surface reflectance, digital image synthesis, intensity values, highlighting artifacts, image based measurement system, bidirectional reflectance distribution function, BRDF values, reflectance model, diffuse reflectance coefficient, compact description, measured surface properties, arbitrary shape, measurement system, standard CCD camera, light source.
AbstractWe present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used
Pages219-226
NotesThe conference was held in Gramado, RS, Brazil, from October 17 to 20.
OrganizationSBC - Brazilian Computer Society
Tertiary TypeFull Paper
Size954 KiB
Number of Files1
Target File219-226.pdf
Last Update2002:11.06.02.00.00 sid.inpe.br/banon/2001/03.30.15.38 administrator
Metadata Last Update2020:02.19.02.58.51 sid.inpe.br/banon/2001/03.30.15.38 administrator {D 2000}
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History2008-07-17 14:10:50 :: administrator -> banon ::
2008-08-26 15:23:02 :: banon -> administrator ::
2009-08-13 20:36:58 :: administrator -> banon ::
2010-08-28 20:00:10 :: banon -> administrator ::
2020-02-19 02:58:51 :: administrator -> :: 2000
Empty Fieldsaccessionnumber affiliation archivingpolicy archivist area booktitle callnumber copyholder copyright creatorhistory descriptionlevel dissemination documentstage doi e-mailaddress edition electronicmailaddress format group holdercode isbn issn label language lineage mark mirrorrepository nextedition nexthigherunit numberofvolumes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup readpermission resumeid rightsholder secondarydate secondarykey secondarymark secondarytype serieseditor session shorttitle sponsor subject tertiarymark type url versiontype volume
Access Date2020, Nov. 26

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