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Reference TypeConference Paper (Conference Proceedings)
Sitesibgrapi.sid.inpe.br
Identifier6qtX3pFwXQZeBBx/w5v44
Repositorysid.inpe.br/banon/2002/11.06.12.09
Last Update2002:11.06.02.00.00 administrator
Metadatasid.inpe.br/banon/2002/11.06.12.09.43
Metadata Last Update2020:02.19.02.58.51 administrator
Citation KeyMayer:2000:ImTeAn
TitleImage-based texture analysis for realistic image synthesis
Year2000
DateOctober
Access Date2021, Jan. 19
Number of Files1
Size954 KiB
Context area
AuthorMayer, Heinz
EditorCarvalho, Paulo Cezar Pinto
Walter, Marcelo
Conference NameBrazilian Symposium on Computer Graphics and Image Processing, 13 (SIBGRAPI)
Conference LocationGramado, RS, Brazil
Pages219-226
PublisherIEEE Computer Society
Publisher CityLos Alamitos
Tertiary TypeFull Paper
OrganizationSBC - Brazilian Computer Society
History2008-07-17 14:10:50 :: administrator -> banon ::
2008-08-26 15:23:02 :: banon -> administrator ::
2009-08-13 20:36:58 :: administrator -> banon ::
2010-08-28 20:00:10 :: banon -> administrator ::
2020-02-19 02:58:51 :: administrator -> :: 2000
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Content TypeExternal Contribution
Keywordsimage texture, image based texture analysis, realistic image synthesis, surface reflectance, digital image synthesis, intensity values, highlighting artifacts, image based measurement system, bidirectional reflectance distribution function, BRDF values, reflectance model, diffuse reflectance coefficient, compact description, measured surface properties, arbitrary shape, measurement system, standard CCD camera, light source.
AbstractWe present a method to measure reflectance and texture of surfaces in a one step process. For later use in digital image synthesis, it is mandatory to separate the gathered intensity values into these two parts to eliminate highlighting artifacts from textures. Our image based measurement system delivers bidirectional reflectance distribution function (BRDF) values distributed over the surface of the material under investigation. After fitting a reflectance model to the gathered data, we estimate the modulation of the diffuse reflectance coefficient which represents the texture. The last step analyzes the texture to get a parameterized and compact description of the measured surface properties. These results allow us to apply the gathered surface properties to objects with arbitrary shape and size. To keep the measurement system simple, a standard CCD camera and light source are used
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data URLhttp://urlib.net/rep/6qtX3pFwXQZeBBx/w5v44
zipped data URLhttp://urlib.net/zip/6qtX3pFwXQZeBBx/w5v44
Target File219-226.pdf
User Groupadministrator
Visibilityshown
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Host Collectionsid.inpe.br/banon/2001/03.30.15.38
Notes area
NotesThe conference was held in Gramado, RS, Brazil, from October 17 to 20.
Empty Fieldsaccessionnumber affiliation archivingpolicy archivist area booktitle callnumber copyholder copyright creatorhistory descriptionlevel dissemination documentstage doi e-mailaddress edition electronicmailaddress format group holdercode isbn issn label language lineage mark mirrorrepository nextedition nexthigherunit numberofvolumes orcid parameterlist parentrepositories previousedition previouslowerunit progress project readergroup readpermission resumeid rightsholder secondarydate secondarykey secondarymark secondarytype serieseditor session shorttitle sponsor subject tertiarymark type url versiontype volume

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